TTA-COPE: Test-Time Adaptation for Category-Level Object Pose Estimation
Taeyeop Lee, Jonathan Tremblay, Valts Blukis, Bowen Wen, Byeong-Uk Lee, Inkyu Shin, Stan Birchfield, In So Kweon, Kuk-Jin Yoon
IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2023)